Semiconductor Evaluation Equipment - メーカー・企業と業務用製品

Power semiconductor evaluation device

Testing compliant with reliability standards such as AEC-Q101, AQG324, and JESD22 is possible!

We would like to introduce the "Power Semiconductor Evaluation Equipment" that we handle. Power semiconductors using SiC and IGBT are key devices that enable high-efficiency power conversion. Evaluating the long-term reliability of products and the thermal characteristics of packages is becoming increasingly important. We offer semiconductor evaluation services and evaluation equipment in collaboration with partner companies. Our solutions are particularly suitable for evaluations under the stringent conditions required for automotive applications. 【Features】 ■ High-temperature, high-humidity dynamic reverse bias test system and IGBT power cycle test system available ■ Capable of measuring leakage currents at the nA level ■ Equipped with a device short-circuit recovery function ■ Power cycle tests can be conducted in units of seconds ■ Designed with the safety of the experimenter in mind *For more details, please download the PDF or feel free to contact us.

企業：SMFLレンタル
価格：Other

Testing Equipment and Devices
Semiconductor inspection/test equipment
Semiconductor Evaluation Equipment

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[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells

Quantitative evaluation of dopants and evaluation of carrier distribution.

This is an example of quantitatively evaluating the dopant concentration distribution directly beneath the electrode in back contact type crystalline silicon solar cells. Additionally, by evaluating the carrier distribution, it is possible to determine the polarity of p/n and visualize the depletion layer in the cross-sectional direction.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis
Semiconductor Evaluation Equipment

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SiC semiconductor evaluation device "SemiScope"

SiC semiconductor evaluation device using photoluminescence (PL) imaging method

"SemiScope" is a PL imaging device that can measure photoluminescence (PL) images with a resolution of less than 1μm. By using a tiling function that allows imaging measurements while moving the sample, it is possible to obtain PL images of the entire 6-inch wafer with a resolution of approximately 3.3 billion pixels. It visualizes crystal defects in SiC wafers. Non-contact and non-destructive testing can be performed quickly using the PL imaging method. 【Features】 - SiC semiconductor evaluation device - Visualization of crystal defects in SiC wafers - Non-contact, non-destructive testing - Short measurement time possible due to PL imaging method For more details, please contact us or download the catalog.

企業：フォトンデザイン
価格：Other

Semiconductor inspection/test equipment
Semiconductor Evaluation Equipment

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Semiconductor Evaluation Equipment - メーカー・企業と業務用製品 | イプロスものづくり

Semiconductor Evaluation Equipmentの製品一覧

Power semiconductor evaluation device

[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells

SiC semiconductor evaluation device "SemiScope"

Semiconductor Evaluation Equipmentの関連カテゴリ